IC 테스트 프로브
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
Home / Products / IC 테스트 프로브 / 3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
IC 테스트 프로브
IC 테스트 프로브
Part No.:
Request Quote
Related Products

Related Probes

5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below

Thank you for your interest — download below