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High Current Solutions

High CurrentTesting Solutions

Patented high-current spring probes with a direct current path that greatly reduces contact resistance. Suitable for EV battery testing, IC testing and other high-current applications, with fully customizable precision test solutions.
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Core Technology

Why Choose C.C.P. High Current Probes?

Standard Pin
Conventional Spring Probe
Current flows from the bottom plunger through the barrel wall and on to the top plunger. Contact resistance between the barrel wall and the plunger rises gradually with use, and at high currents this can burn out the spring.
Bottom Plunger
↓ Current flows through the barrel wall
Barrel Wall
↓ Bypasses the spring
Top Plunger
⚠ Contact resistance rises with test cycles; risk of burnout at high current
VS
C.C.P. High Current Pin · Patented Design
High Current Spring Probe
A center plunger carries the current by the shortest path straight to the top plunger, bypassing the spring completely. Contact resistance drops sharply, and probe life and reliability improve significantly.
Bottom Plunger
↓ Current follows the central direct path
Center Plunger
↓ Straight to the top, never through the spring
Top Plunger
✓ Stable contact resistance, significantly longer life
Applications

Key Applications

Battery Testing
Lithium Battery / EV Battery Test

The probe contacts the PCB, closes the circuit and activates the lithium battery for testing. A specially designed contact tip ensures stable high-current transmission, suited to EV battery modules, packs and industrial energy storage systems.

Stable high-current transmission with low, consistent contact resistance
Suitable for EV battery packs, modules and industrial energy storage systems
Contact tip shape and size customizable to the battery specification
IC Testing
High-Current IC Testing

A coaxial design integrates the sense pin and the current pin into a single probe structure. The integrated current pin design significantly reduces electrical resistance, making it suitable for high-current IC functional testing and burn-in testing.

Sense pin and current pin integrated coaxially for a more stable signal
Integrated design greatly reduces electrical resistance
Suitable for burn-in testing and high-current functional verification

Coaxial Design · IC Testing

Coaxial High Current Probe
Integrated Dual-Function Design

The coaxial high-current probe C.C.P. developed for IC testing integrates the sensor pin and the current test pin into one probe structure. The current test pin uses a one-piece design whose electrical resistance is significantly better than conventional separated designs.

Sensor pin and current pin combined coaxially, saving test space
One-piece current test pin design significantly lowers electrical resistance
Suitable for high-current IC functional testing and burn-in
Contact tip style customizable to the IC package specification

Probe Structure

Top Plunger

│

Sensor Pin

│

Coaxial Current Pin

│

Spring (carries no current)

│

Bottom Plunger

Coaxial and integrated · significantly lower resistance

Product Features

Product Design Features

Patented Design
C.C.P. holds patents on high-current spring probe technology. The central direct current path is a solution unique in the industry, ensuring stable current transmission and preventing spring burnout.
Low Contact Resistance
The one-piece plunger design carries current straight to the top. Contact resistance stays stable and far below conventional designs, keeping test data consistent and accurate.
Customization Flexibility
Fully customizable to your current requirements, contact tip shape, dimensions and plating specification, backed by industry-leading proprietary plating technology.

Need a High-Current Test Solution?

Tell us about your application and current requirements, and C.C.P. engineers will recommend the most suitable probe design and customization plan.
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