IC test probes support ultra-fine pitches as small as 0.12mm, offering over 80 design options to meet a wide range of semiconductor packaging test requirements.

Suitable for various PCB testing applications, featuring 70 design variants. In addition to standardized products, custom-designed solutions are also available to meet complex testing requirements.

Providing over 30 different specifications of high-current battery test probes, designed for various battery types and testing environments.

With a minimum pitch of 0.12mm, C.C.P. Contact Probes’ proprietary wafer-level testing solutions are designed for the most advanced packaging processes.

C.C.P. Contact Probes’ patented high-frequency test solutions feature coaxial probe designs and pressurized conductive rubber fixtures, supporting frequencies up to 77 GHz.

Patented probe designs with current ratings exceeding 5A, ideal for high-power components and rigorous power IC testing environments.

C.C.P. Contact Probes researches, designs, and manufactures advanced test fixtures, delivering integrated final test solutions spanning from individual components to complete systems.

Featuring high-frequency capabilities, our pogo pin towers and quad-pin blocks deliver customized connectivity solutions tailored for automated test equipment (ATE).

With a minimum pitch of 0.45mm, C.C.P. Contact Probes  offers specialized probe cards and test fixture assemblies for precise panel and display testing applications.