C.C.P. offers four tip types (Blade, Ladder, Half Moon, Crown) with a Kelvin gap of 70 to 100μm, for precise low-resistance measurement on QFN, QFP and BGA packages, with probe life over 200,000 cycles.
Min. Probe Pitch
Tip Types
Probe Life (cycles)
Kelvin Contact Solutions
Kelvin contact technology takes its name from the British physicist Lord Kelvin and is used to measure resistances below 1Ω. C.C.P. achieves accurate four-wire measurement by using one probe to sense current and another to adjust voltage, with four tip types — Blade, Ladder, Half Moon and Crown — and a Kelvin gap of 0.07 to 0.1mm.
QFN / QFP
BGA
Low-Resistance Measurement
Tip Types
BLADE TIP
The most widely used Kelvin test tip, suitable for general contact applications.
LADDER TIP
Similar to the blade tip but with more precise positioning, for applications that need an exact contact point.
HALF MOON TIP
Mainly used on QFN and QFP packages, suited to contacting the side of the pad.
CROWN TIP
Every prong can penetrate the test area, so fixture orientation does not matter and installation is more flexible.
Specifications
| Specification | Value |
|---|---|
| IC Type | QFN / QFP / BGA |
| IC Size | 2×2 ~ 20×20 mm² |
| Min. Pitch | 0.30 mm |
| Kelvin Gap | 70 ~ 100 μm |
| Probe Life | >200,000 cycles |
Applications
KELVIN CONTACT
Designed for precise low-resistance testing, with 0.07 to 0.1mm probes and a choice of tip types to ensure measurement accuracy.
Kelvin gap of 70 to 100μm for precise contact on balls and pads
Supports QFN, QFP, BGA and other packages
Four tip types for different contact requirements
LOW RESISTANCE
Suitable for precise measurement of power devices, MOSFETs and other low-resistance ICs. The four-wire design eliminates lead resistance error and ensures reliable measurement.
Four-wire measurement eliminates lead resistance effects
Contact Resistance <75mΩ（AVG）
Current rating 1A to 3A continuous
C.C.P. provides custom solutions. Have a special requirement? Our engineers are ready for your challenge.
