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IC Test Probes

80+ Designs · Min Pitch 0.12mm · Single / Double Active

Testing Solutions
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Total 35 Probes
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DE3-031DF21-01A0
3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
Single Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
圓頭型 (D)
Spring Force
30 g ±20%
View Details ↓ 2D Drawing
DE1-035EG57-01A0
6.86 mm, IC Test Probes, 0.35 mm Diameter, 1A, DE1-035EG57-01A0
Double Active
Length
6.86 mm
Tube OD
0.35 mm
DUT Tip Type
鈍錐型 (E)
LB Tip Type
平頭型 (G)
Rated Current
1A
Spring Force
20 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-031BF40-02C0
5.70 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF40-02C0
Double Active
Length
5.7 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
View Details ↓ 2D Drawing
CM-M2-075-20147
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
Single Active
Length
18.93 mm
Tube OD
0.75 mm
DUT Tip Type
Cup(A)
Rated Current
3A
Spring Force
150 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-031BF32-01C0
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
Double Active
Length
4.75 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
View Details ↓ 2D Drawing
PE4-035BT24-01A0
3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
Single Active
Length
3.5 mm
Tube OD
0.35 mm
DUT Tip Type
3邊鑿刀 (T)
LB Tip Type
尖錐型 (B)
Rated Current
1A
Spring Force
40 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-031DF24-01F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
Single Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
35 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-029DF15-02F0
2.20 mm, IC Test Probes, 0.29 mm Diameter, PE4-029DF15-02F0
Single Active
Length
2.2 mm
Tube OD
0.29 mm
DUT Tip Type
4爪皇冠 (F)
Spring Force
25 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-028EF40-06A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-06A0
Double Active
Length
5.7 mm
Tube OD
0.28 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
20 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-028EF40-05A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
Double Active
Length
5.7 mm
Tube OD
0.28 mm
DUT Tip Type
4爪鋸齒 (P)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
28 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-031DF40-02A0
5.70 mm, IC Test Probes, 0.31 mm Diameter, DE1-031DF40-02A0
Double Active
Length
5.7 mm
Tube OD
0.31 mm
DUT Tip Type
圓頭型 (D)
LB Tip Type
4爪鋸齒 (P)
Spring Force
14 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-035BE12-01B0
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
Double Active
Length
2 mm
Tube OD
0.35 mm
DUT Tip Type
尖錐型 (B)
LB Tip Type
鈍錐型 (E)
Spring Force
20 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-038FF50-03F0
7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
Double Active
Length
7.8 mm
Tube OD
0.38 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
22 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-029FF35-01A0
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
Single Active
Length
5.3 mm
Tube OD
0.29 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
4爪鋸齒 (P)
Spring Force
25 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-035DF24-03F0
3.20 mm, IC Test Probes, 0.35 mm Diameter, DE4-035DF24-03F0
Single Active
Length
3.2 mm
Tube OD
0.35 mm
DUT Tip Type
4爪皇冠 (F)
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-052EF23-02F0
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
Single Active
Length
3.35 mm
Tube OD
0.52 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
35 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE1-030DF32-01F0
4.75 mm, IC Test Probes, 0.30 mm Diameter, PE1-030DF32-01F0
Double Active
Length
4.75 mm
Tube OD
0.3 mm
DUT Tip Type
4爪皇冠 (F)
Spring Force
38 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE1-031DF23-03F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE1-031DF23-03F0
Double Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-026BF40-01A0
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
Double Active
Length
5.7 mm
Tube OD
0.26 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
尖錐型 (B)
Rated Current
1A
Spring Force
14 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-051EF23-01F0
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
Single Active
Length
3.3 mm
Tube OD
0.51 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-052DF17-01F0
2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052DF17-01F0
Single Active
Length
2.57 mm
Tube OD
0.52 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
35 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE4-056EF20-01F0
2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A, DE4-056EF20-01F0
Single Active
Length
2.85 mm
Tube OD
0.56 mm
DUT Tip Type
4爪皇冠 (F)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
25 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE3-031DF21-02F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-02F0
Single Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE3-031DF21-03F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-03F0
Single Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
35 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE3-031DF22-02A0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF22-02A0
Single Active
Length
3.3 mm
Tube OD
0.31 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
40 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-026DF24-01F0
3.30 mm, IC Test Probes, 0.26 mm Diameter, 1A, PE4-026DF24-01F0
Single Active
Length
3.3 mm
Tube OD
0.26 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-035DF24-01F0
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
Single Active
Length
3.35 mm
Tube OD
0.35 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
32 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-035DF24-03F0
3.20 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-03F0
Single Active
Length
3.2 mm
Tube OD
0.35 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
30 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
PE4-056DF20-03F0
3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
Single Active
Length
3 mm
Tube OD
0.56 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
45 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-020BE40-01A0
5.70 mm, IC Test Probes, 0.20 mm Diameter, 1A, DE1-020BE40-01A0
Double Active
Length
5.7 mm
Tube OD
0.2 mm
DUT Tip Type
尖錐型 (B)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
12 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-028DF40-01B0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DF40-01B0
Double Active
Length
5.7 mm
Tube OD
0.28 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
28 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-028DD40-01A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
Double Active
Length
5.7 mm
Tube OD
0.28 mm
DUT Tip Type
圓頭型 (D)
LB Tip Type
圓頭型 (D)
Rated Current
1A
Spring Force
25 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-028BE40-04A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028BE40-04A0
Double Active
Length
5.7 mm
Tube OD
0.28 mm
DUT Tip Type
尖錐型 (B)
LB Tip Type
鈍錐型 (E)
Rated Current
1A
Spring Force
20 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-026EF31-01A0
4.60 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026EF31-01A0
Double Active
Length
4.6 mm
Tube OD
0.26 mm
DUT Tip Type
鈍錐型 (E)
LB Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
20 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD
DE1-026DF40-02A0
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
Double Active
Length
5.7 mm
Tube OD
0.26 mm
DUT Tip Type
4爪皇冠 (F)
Rated Current
1A
Spring Force
18 g ±20%
View Details ↓ 2D Drawing↓ 3D CAD

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