IC TEST PROBES
6.86 mm, IC Test Probes, 0.35 mm Diameter, 1A, DE1-035EG57-01A0
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IC Test Probes
DE1-035EG57-01A0
IC Test Probes
Part No.:DE1-035EG57-01A0
Double Active
Length
6.86mm
Tube OD
0.35mm
Rated Current
1A
DUT Tip Type
Blunt Awl (E)
Load Board Tip Type
Flat (G)
Spring Force
20g ±20%
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Description
DE1-035EG57-01A0 is a 6.86 mm long IC test probe with a barrel diameter of 0.35 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length6.86 mm
Barrel OD0.35 mm
DUT Contact Tip TypeConical 90°, 120° (E)
LB Contact Tip TypeFlat(G)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.6 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
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