IC TEST PROBES · TESTING SOLUTIONS
6.86 mm, IC Test Probes, 0.35 mm Diameter, 1A, DE1-035EG57-01A0
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IC Test Probes
DE1-035EG57-01A0
IC Test Probes · Testing Solutions
Part No.:DE1-035EG57-01A0
Double Active
Length
6.86mm
Tube OD
0.35mm
Rated Current
1A
DUT Tip Type
鈍錐型 (E)
Load Board Tip Type
平頭型 (G)
Spring Force
20g ±20%
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Description
DE1-035EG57-01A0 是一款 6.86mm 長的 IC 測試探針，針管外徑 0.35mm，額定電流 1A，採用 Double Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Double Active
長度6.86 mm
針管外徑0.35 mm
DUT 接觸頭類型鈍錐型 (E)
LB 接觸頭類型平頭型 (G)
額定電流1A
彈力20 g ±20%
建議行程0.6 mm
全程行程0.8 mm
壽命循環200,000 次
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