IC TEST PROBES · TESTING SOLUTIONS
4.75 mm, IC Test Probes, 0.30 mm Diameter, PE1-030DF32-01F0
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IC Test Probes
PE1-030DF32-01F0
IC Test Probes · Testing Solutions
Part No.:PE1-030DF32-01F0
Double Active
Length
4.75mm
Tube OD
0.30mm
DUT Tip Type
4爪皇冠 (F)
Spring Force
38g ±20%
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Description
PE1-030DF32-01F0 是一款 4.75mm 長的 IC 測試探針，針管外徑 0.30mm，採用 Double Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Double Active
長度4.75 mm
針管外徑0.30 mm
DUT 接觸頭類型4爪皇冠 (F)
彈力38 g ±20%
建議行程0.7 mm
全程行程0.85 mm
壽命循環200,000 次
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