IC TEST PROBES
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
Home / Products / IC Test Probes / 5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
IC Test Probes
DE1-028DD40-01A0
IC Test Probes
Part No.:DE1-028DD40-01A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
Sphere (D)
Load Board Tip Type
Sphere (D)
Spring Force
25g ±20%
Download 2D Drawing Download 3D CAD Request Quote
Description
DE1-028DD40-01A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
Rated Current1A
Spring Force25 g ±20%
Recommended Travel0.65 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
Related Products

Related Probes

5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
DE4-029FF35-01A0
Spring Force25 g ±20%
Diameter0.29 mm
Length5.30 mm
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
DE4-051EF23-01F0
Current1A A
Spring Force30 g ±20%
Diameter0.51 mm
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
DE1-035BE12-01B0
Spring Force20 g ±20%
Diameter0.35 mm
Length2.00 mm

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below