IC TEST PROBES
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
Home / Products / IC Test Probes / 4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
IC Test Probes
DE1-031BF32-01C0
IC Test Probes
Part No.:DE1-031BF32-01C0
Double Active
Length
4.75mm
Tube OD
0.31mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Description
DE1-031BF32-01C0 is a 4.75 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length4.75 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A

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