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IC TEST PROBES
3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
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3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
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IC Test Probes
IC Test Probes
Part No.:
PE4-035BT24-01A0
Single Active
Length
3.50
mm
Tube OD
0.35
mm
Rated Current
1A
DUT Tip Type
3-Side Chiseled (T)
Load Board Tip Type
Conical 60° (B)
Spring Force
40
g ±20%
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Description
PE4-035BT24-01A0 is a 3.50 mm long IC test probe with a barrel diameter of 0.35 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
Structure
Single Active
Length
3.50 mm
Barrel OD
0.35 mm
DUT Contact Tip Type
3 Sided Chiseled(T)
LB Contact Tip Type
Conical 60°(B)
Rated Current
1A
Spring Force
40 g ±20%
Recommended Travel
0.45 mm
Total Travel
0.7 mm
Life Cycles
200,000 cycles
Related Products
Related Probes
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
DE4-052EF23-02F0
Current
1A A
Spring Force
35 g ±20%
Diameter
0.52 mm
3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
DE3-031DF21-01A0
Spring Force
30 g ±20%
Diameter
0.31 mm
Length
3.30 mm
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
DE1-026BF40-01A0
Current
1A A
Spring Force
14 g ±20%
Diameter
0.26 mm
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