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IC TEST PROBES
5.70 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF40-02C0
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5.70 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF40-02C0
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IC Test Probes
IC Test Probes
Part No.:
DE1-031BF40-02C0
Double Active
Length
5.70
mm
Tube OD
0.31
mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
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Description
DE1-031BF40-02C0 is a 5.70 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
Structure
Double Active
Length
5.70 mm
Barrel OD
0.31 mm
DUT Contact Tip Type
4 Points Crown(F)
Rated Current
1A
Related Products
Related Probes
5.70 mm, IC Test Probes, 0.20 mm Diameter, 1A, DE1-020BE40-01A0
DE1-020BE40-01A0
Current
1A A
Spring Force
12 g ±20%
Diameter
0.20 mm
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE1-031DF23-03F0
PE1-031DF23-03F0
Current
1A A
Spring Force
30 g ±20%
Diameter
0.31 mm
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
DE1-028DD40-01A0
Current
1A A
Spring Force
25 g ±20%
Diameter
0.28 mm
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