IC TEST PROBES
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
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IC Test Probes
DE1-035BE12-01B0
IC Test Probes
Part No.:DE1-035BE12-01B0
Double Active
Length
2.00mm
Tube OD
0.35mm
DUT Tip Type
Conical 60° (B)
Load Board Tip Type
Blunt Awl (E)
Spring Force
20g ±20%
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Description
DE1-035BE12-01B0 is a 2.00 mm long IC test probe with a barrel diameter of 0.35 mm. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length2.00 mm
Barrel OD0.35 mm
DUT Contact Tip TypeConical 60°(B)
LB Contact Tip TypeConical 90°,120°(E)
Spring Force20 g ±20%
Recommended Travel0.3 mm
Total Travel0.4 mm
Life Cycles200,000 cycles
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