IC TEST PROBES
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
Home / Products / IC Test Probes / 5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
IC Test Probes
DE1-026DF40-02A0
IC Test Probes
Part No.:DE1-026DF40-02A0
Double Active
Length
5.70mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Spring Force
18g ±20%
Description
DE1-026DF40-02A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.26 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.26 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force18 g ±20%
Recommended Travel0.65 mm
Total Travel0.85 mm
Life Cycles200,000 cycles

Please fill in your details before downloading

Thank you for your interest — download below