IC TEST PROBES
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-03F0
Home / Products / IC Test Probes / 3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-03F0
IC Test Probes
PE3-031DF21-03F0
IC Test Probes
Part No.:PE3-031DF21-03F0
Single Active
Length
3.30mm
Tube OD
0.31mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Spring Force
35g ±20%
Download 2D Drawing Download 3D CAD Request Quote
Description
PE3-031DF21-03F0 is a 3.30 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.30 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force35 g ±20%
Recommended Travel0.4 mm
Total Travel0.6 mm
Life Cycles200,000 cycles
Related Products

Related Probes

3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
PE4-035DF24-01F0
Current1A A
Spring Force32 g ±20%
Diameter0.35 mm
2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052DF17-01F0
2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052DF17-01F0
DE4-052DF17-01F0
Current1A A
Spring Force35 g ±20%
Diameter0.52 mm
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE1-031DF23-03F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE1-031DF23-03F0
PE1-031DF23-03F0
Current1A A
Spring Force30 g ±20%
Diameter0.31 mm

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below