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IC TEST PROBES · TESTING SOLUTIONS
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
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3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
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IC Test Probes
IC Test Probes · Testing Solutions
Part No.:
PE4-035DF24-01F0
Single Active
Length
3.35
mm
Tube OD
0.35
mm
Rated Current
1A
DUT Tip Type
4爪皇冠 (F)
Spring Force
32
g ±20%
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Description
PE4-035DF24-01F0 是一款 3.35mm 長的 IC 測試探針,針管外徑 0.35mm,額定電流 1A,採用 Single Active 結構,適用於半導體 IC 測試應用。
Product Specifications
Structure
Single Active
Length
3.35 mm
Barrel OD
0.35 mm
DUT Contact Tip Type
4 Points Crown(F)
Rated Current
1A
Spring Force
32 g ±20%
Recommended Travel
0.45 mm
Total Travel
0.7 mm
Life Cycles
200,000 cycles
Related Products
Related Probes
3.20 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-03F0
PE4-035DF24-03F0
Current
1A A
Spring Force
30 g ±20%
Diameter
0.35 mm
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028BE40-04A0
DE1-028BE40-04A0
Current
1A A
Spring Force
20 g ±20%
Diameter
0.28 mm
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
DE4-052EF23-02F0
Current
1A A
Spring Force
35 g ±20%
Diameter
0.52 mm
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