IC TEST PROBES · TESTING SOLUTIONS
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
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IC Test Probes
DE4-052EF23-02F0
IC Test Probes · Testing Solutions
Part No.:DE4-052EF23-02F0
Single Active
Length
3.35mm
Tube OD
0.52mm
Rated Current
1A
DUT Tip Type
4爪皇冠 (F)
Load Board Tip Type
鈍錐型 (E)
Spring Force
35g ±20%
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Description
DE4-052EF23-02F0 是一款 3.35mm 長的 IC 測試探針，針管外徑 0.52mm，額定電流 1A，採用 Single Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Single Active
長度3.35 mm
針管外徑0.52 mm
DUT 接觸頭類型4爪皇冠 (F)
LB 接觸頭類型鈍錐型 (E)
額定電流1A
彈力35 g ±20%
建議行程0.45 mm
全程行程0.65 mm
壽命循環200,000 次
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