IC TEST PROBES · TESTING SOLUTIONS
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
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IC Test Probes
DE4-052EF23-02F0
IC Test Probes · Testing Solutions
Part No.:DE4-052EF23-02F0
Single Active
Length
3.35mm
Tube OD
0.52mm
Rated Current
1A
DUT Tip Type
4爪皇冠 (F)
Load Board Tip Type
鈍錐型 (E)
Spring Force
35g ±20%
Description
DE4-052EF23-02F0 是一款 3.35mm 長的 IC 測試探針,針管外徑 0.52mm,額定電流 1A,採用 Single Active 結構,適用於半導體 IC 測試應用。
Product Specifications
StructureSingle Active
Length3.35 mm
Barrel OD0.52 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force35 g ±20%
Recommended Travel0.45 mm
Total Travel0.65 mm
Life Cycles200,000 cycles

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