IC TEST PROBES · TESTING SOLUTIONS
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
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IC Test Probes
DE4-029FF35-01A0
IC Test Probes · Testing Solutions
Part No.:DE4-029FF35-01A0
Single Active
Length
5.30mm
Tube OD
0.29mm
DUT Tip Type
4爪皇冠 (F)
Load Board Tip Type
4爪鋸齒 (P)
Spring Force
25g ±20%
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Description
DE4-029FF35-01A0 是一款 5.30mm 長的 IC 測試探針，針管外徑 0.29mm，採用 Single Active 結構，適用於半導體 IC 測試應用。
Product Specifications
StructureSingle Active
Length5.30 mm
Barrel OD0.29 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip Type4 Points Serrated(P)
Spring Force25 g ±20%
Recommended Travel0.5 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
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