IC TEST PROBES
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
Home / Products / IC Test Probes / 5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
IC Test Probes
DE1-026BF40-01A0
IC Test Probes
Part No.:DE1-026BF40-01A0
Double Active
Length
5.70mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 60° (B)
Spring Force
14g ±20%
Description
DE1-026BF40-01A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.26 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.26 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 60°(B)
Rated Current1A
Spring Force14 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles

Please fill in your details before downloading

Thank you for your interest — download below