IC TEST PROBES · TESTING SOLUTIONS
4.60 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026EF31-01A0
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IC Test Probes
DE1-026EF31-01A0
IC Test Probes · Testing Solutions
Part No.:DE1-026EF31-01A0
Double Active
Length
4.60mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
鈍錐型 (E)
Load Board Tip Type
4爪皇冠 (F)
Spring Force
20g ±20%
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Description
DE1-026EF31-01A0 是一款 4.60mm 長的 IC 測試探針，針管外徑 0.26mm，額定電流 1A，採用 Double Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Double Active
長度4.60 mm
針管外徑0.26 mm
DUT 接觸頭類型鈍錐型 (E)
LB 接觸頭類型4爪皇冠 (F)
額定電流1A
彈力20 g ±20%
建議行程0.5 mm
全程行程0.8 mm
壽命循環200,000 次
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