IC TEST PROBES · TESTING SOLUTIONS
4.60 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026EF31-01A0
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IC Test Probes
DE1-026EF31-01A0
IC Test Probes · Testing Solutions
Part No.:DE1-026EF31-01A0
Double Active
Length
4.60mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
鈍錐型 (E)
Load Board Tip Type
4爪皇冠 (F)
Spring Force
20g ±20%
Description
DE1-026EF31-01A0 是一款 4.60mm 長的 IC 測試探針,針管外徑 0.26mm,額定電流 1A,採用 Double Active 結構,適用於半導體 IC 測試應用。
Product Specifications
StructureDouble Active
Length4.60 mm
Barrel OD0.26 mm
DUT Contact Tip TypeConical 90°, 120° (E)
LB Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.5 mm
Total Travel0.8 mm
Life Cycles200,000 cycles

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