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IC TEST PROBES · TESTING SOLUTIONS
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
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18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
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IC Test Probes
IC Test Probes · Testing Solutions
Part No.:
CM-M2-075-20147
Single Active
Length
18.93
mm
Tube OD
0.75
mm
Rated Current
3A
DUT Tip Type
Cup(A)
Spring Force
150
g ±20%
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Description
CM-M2-075-20147 是一款 18.93mm 長的 IC 測試探針,針管外徑 0.75mm,額定電流 3A,採用 Single Active 結構,適用於半導體 IC 測試應用。
Product Specifications
結構
Single Active
長度
18.93 mm
針管外徑
0.75 mm
接觸頭類型
Cup(A)
額定電流
3A
尖端材料
BeCu
尖端鍍層
Gold
針管基材
PhBz
針管鍍層
Gold
彈簧基材
SWP
彈簧鍍層
Gold
全程行程
2 mm
建議行程
1 mm
彈簧力
150 gf
壽命循環
100,000 次
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Current
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Spring Force
20 g ±20%
Diameter
0.26 mm
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
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Current
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Spring Force
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Diameter
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3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
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Current
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Spring Force
45 g ±20%
Diameter
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