IC-PRüFNADELN
7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
Home / Products / IC-Prüfnadeln / 7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
IC-Prüfnadeln
IC-Prüfnadeln
Part No.:
Request Quote
Related Products

Related Probes

18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below

Thank you for your interest — download below