Тестовые зонды для ИС
7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
Home / Products / Тестовые зонды для ИС / 7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
Тестовые зонды для ИС
Тестовые зонды для ИС
Part No.:
Request Quote
Related Products

Related Probes

3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below

Thank you for your interest — download below