IC TEST PROBES
3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
Home / Products / IC Test Probes / 3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
IC Test Probes
DE3-031DF21-01A0
IC Test Probes
Part No.:DE3-031DF21-01A0
Single Active
Length
3.30mm
Tube OD
0.31mm
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Sphere (D)
Spring Force
30g ±20%
Download 2D Drawing Request Quote
Description
DE3‑031DF21‑01A0 is a 3.30 mm‑long IC test probe with a 0.31 mm barrel outer diameter. It features a Single Active structure and is designed for semiconductor IC testing applications.
Product Specifications
StructureSingle Active
Length3.30 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeSphere(D)
Spring Force30 g ±20%
Recommended Travel0.4 mm
Total Travel0.55 mm
Life Cycles200,000 cycles
Related Products

Related Probes

2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A, DE4-056EF20-01F0
2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A, DE4-056EF20-01F0
DE4-056EF20-01F0
Current1A A
Spring Force25 g ±20%
Diameter0.56 mm
3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
PE4-035BT24-01A0
Current1A A
Spring Force40 g ±20%
Diameter0.35 mm
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
DE1-031BF32-01C0
Current1A A
Diameter0.31 mm
Length4.75 mm

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below