IC TEST PROBES · TESTING SOLUTIONS
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
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IC Test Probes
DE1-026DF40-02A0
IC Test Probes · Testing Solutions
Part No.:DE1-026DF40-02A0
Double Active
Length
5.70mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
4爪皇冠 (F)
Spring Force
18g ±20%
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Description
DE1-026DF40-02A0 是一款 5.70mm 長的 IC 測試探針，針管外徑 0.26mm，額定電流 1A，採用 Double Active 結構，適用於半導體 IC 測試應用。
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.26 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force18 g ±20%
Recommended Travel0.65 mm
Total Travel0.85 mm
Life Cycles200,000 cycles
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5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
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Current1A A
Spring Force14 g ±20%
Diameter0.26 mm

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