IC TEST PROBES
3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
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IC Test Probes
DE4-051EF23-01F0
IC Test Probes
Part No.:DE4-051EF23-01F0
Single Active
Length
3.30mm
Tube OD
0.51mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Blunt Awl (E)
Spring Force
30g ±20%
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Description
DE4-051EF23-01F0 is a 3.30 mm long IC test probe with a barrel diameter of 0.51 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.30 mm
Barrel OD0.51 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force30 g ±20%
Recommended Travel0.35 mm
Total Travel0.55 mm
Life Cycles200,000 cycles
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