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Group A · IC Testing Probes

IC 测试探针

80+ 款设计 · 最小间距 0.12mm · Single / Double Active

Testing Solutions
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Total 35 Probes
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5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028BE40-04A0
Single Active
Length
0 mm
Tube OD
0 mm
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3.50 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035BT24-01A0
Single Active
Length
0 mm
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0 mm
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4.60 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026EF31-01A0
Single Active
Length
0 mm
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0 mm
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4.75 mm, IC Test Probes, 0.30 mm Diameter, PE1-030DF32-01F0
Single Active
Length
0 mm
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0 mm
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4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
Single Active
Length
0 mm
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0 mm
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5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
Single Active
Length
0 mm
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0 mm
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5.70 mm, IC Test Probes, 0.20 mm Diameter, 1A, DE1-020BE40-01A0
Single Active
Length
0 mm
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0 mm
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5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
Single Active
Length
0 mm
Tube OD
0 mm
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5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
Single Active
Length
0 mm
Tube OD
0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
Single Active
Length
0 mm
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0 mm
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5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
Single Active
Length
0 mm
Tube OD
0 mm
View Details
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DF40-01B0
Single Active
Length
0 mm
Tube OD
0 mm
View Details
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
Single Active
Length
0 mm
Tube OD
0 mm
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5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-06A0
Single Active
Length
0 mm
Tube OD
0 mm
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5.70 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF40-02C0
Single Active
Length
0 mm
Tube OD
0 mm
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5.70 mm, IC Test Probes, 0.31 mm Diameter, DE1-031DF40-02A0
Single Active
Length
0 mm
Tube OD
0 mm
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6.86 mm, IC Test Probes, 0.35 mm Diameter, 1A, DE1-035EG57-01A0
Single Active
Length
0 mm
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0 mm
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7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
Single Active
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0 mm
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0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE1-031DF23-03F0
Single Active
Length
0 mm
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0 mm
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2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
Single Active
Length
0 mm
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0 mm
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2.20 mm, IC Test Probes, 0.29 mm Diameter, PE4-029DF15-02F0
Single Active
Length
0 mm
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0 mm
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2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052DF17-01F0
Single Active
Length
0 mm
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0 mm
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2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A, DE4-056EF20-01F0
Single Active
Length
0 mm
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0 mm
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3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
Single Active
Length
0 mm
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0 mm
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3.20 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-03F0
Single Active
Length
0 mm
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0 mm
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3.20 mm, IC Test Probes, 0.35 mm Diameter, DE4-035DF24-03F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.30 mm, IC Test Probes, 0.26 mm Diameter, 1A, PE4-026DF24-01F0
Single Active
Length
0 mm
Tube OD
0 mm
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18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
Single Active
Length
0 mm
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0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-02F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF21-03F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE3-031DF22-02A0
Single Active
Length
0 mm
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0 mm
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3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.30 mm, IC Test Probes, 0.51 mm Diameter, 1A, DE4-051EF23-01F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
Single Active
Length
0 mm
Tube OD
0 mm
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3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
Single Active
Length
0 mm
Tube OD
0 mm
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