IC TEST PROBES
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
Home / Products / IC Test Probes / 5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
IC Test Probes
DE1-028EF40-05A0
IC Test Probes
Part No.:DE1-028EF40-05A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
4 Pts Serrated (P)
Load Board Tip Type
Blunt Awl (E)
Spring Force
28g ±20%
Download 2D Drawing Download 3D CAD Request Quote
Description
DE1-028EF40-05A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip Type4 Points Serrated(P)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force28 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
Related Products

Related Probes

3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
3.00 mm, IC Test Probes, 0.56 mm Diameter, 1A, PE4-056DF20-03F0
PE4-056DF20-03F0
Current1A A
Spring Force45 g ±20%
Diameter0.56 mm
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-06A0
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-06A0
DE1-028EF40-06A0
Current1A A
Spring Force20 g ±20%
Diameter0.28 mm
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
PE4-031DF24-01F0
Current1A A
Spring Force35 g ±20%
Diameter0.31 mm

Please fill in your details before downloading

After submitting, you can directly download all 2D drawings and 3D CAD files

Thank you for your interest — download below