IC TEST PROBES · TESTING SOLUTIONS
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
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IC Test Probes
DE1-028EF40-05A0
IC Test Probes · Testing Solutions
Part No.:DE1-028EF40-05A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
4爪鋸齒 (P)
Load Board Tip Type
鈍錐型 (E)
Spring Force
28g ±20%
Description
DE1-028EF40-05A0 是一款 5.70mm 長的 IC 測試探針,針管外徑 0.28mm,額定電流 1A,採用 Double Active 結構,適用於半導體 IC 測試應用。
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip Type4 Points Serrated(P)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force28 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles

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