IC TEST PROBES · TESTING SOLUTIONS
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
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IC Test Probes
DE1-035BE12-01B0
IC Test Probes · Testing Solutions
Part No.:DE1-035BE12-01B0
Double Active
Length
2.00mm
Tube OD
0.35mm
DUT Tip Type
尖錐型 (B)
Load Board Tip Type
鈍錐型 (E)
Spring Force
20g ±20%
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Description
DE1-035BE12-01B0 是一款 2.00mm 長的 IC 測試探針，針管外徑 0.35mm，採用 Double Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Double Active
長度2.00 mm
針管外徑0.35 mm
DUT 接觸頭類型尖錐型 (B)
LB 接觸頭類型鈍錐型 (E)
彈力20 g ±20%
建議行程0.3 mm
全程行程0.4 mm
壽命循環200,000 次
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