IC TEST PROBES · TESTING SOLUTIONS
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
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IC Test Probes
DE4-029FF35-01A0
IC Test Probes · Testing Solutions
Part No.:DE4-029FF35-01A0
Single Active
Length
5.30mm
Tube OD
0.29mm
DUT Tip Type
4爪皇冠 (F)
Load Board Tip Type
4爪鋸齒 (P)
Spring Force
25g ±20%
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Description
DE4-029FF35-01A0 是一款 5.30mm 長的 IC 測試探針，針管外徑 0.29mm，採用 Single Active 結構，適用於半導體 IC 測試應用。
Product Specifications
結構Single Active
長度5.30 mm
針管外徑0.29 mm
DUT 接觸頭類型4爪皇冠 (F)
LB 接觸頭類型4爪鋸齒 (P)
彈力25 g ±20%
建議行程0.5 mm
全程行程0.8 mm
壽命循環200,000 次
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