IC TEST PROBES
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
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IC Test Probes
DE4-029FF35-01A0
IC Test Probes
Part No.:DE4-029FF35-01A0
Single Active
Length
5.30mm
Tube OD
0.29mm
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
4 Pts Serrated (P)
Spring Force
25g ±20%
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Description
DE4-029FF35-01A0 is a 5.30 mm long IC test probe with a barrel diameter of 0.29 mm. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length5.30 mm
Barrel OD0.29 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip Type4 Points Serrated(P)
Spring Force25 g ±20%
Recommended Travel0.5 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
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