IC TEST PROBES · TESTING SOLUTIONS
2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A, DE4-056EF20-01F0
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IC Test Probes
DE4-056EF20-01F0
IC Test Probes · Testing Solutions
Part No.:DE4-056EF20-01F0
Single Active
Length
2.85mm
Tube OD
0.56mm
Rated Current
1A
DUT Tip Type
4 Points Crown (F)
Load Board Tip Type
Conical 90°, 120° (E)
Spring Force
25g ±20%
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Description
DE4-056EF20-01F0 is a 2.85 mm IC test probe with a barrel outer diameter of 0.56 mm and a rated current of 1A. Featuring a Single Active structure, it is designed for semiconductor IC testing applications.
Product Specifications
StructureSingle Active
Length2.85 mm
Barrel OD0.56 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force25 g ±20%
Recommended Travel0.35 mm
Total Travel0.55 mm
Life Cycles200,000 cycles
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