IC TEST PROBES
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028BE40-04A0
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IC Test Probes
DE1-028BE40-04A0
IC Test Probes
Part No.:DE1-028BE40-04A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
Conical 60° (B)
Load Board Tip Type
Blunt Awl (E)
Spring Force
20g ±20%
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Description
DE1-028BE40-04A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip TypeConical 60°(B)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
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